SiPM
WB SERIES
1×1 mm² or 3×3 mm² SiPMs in ultra-compact, quadratic, tileable BGA package
Unique Features
- High photon detection efficiency
- Very low dark count rate
- Ultra high cell densitity
- Fast recovery time
- Non-magnetic
KEY PARAMETERS
| Type | Active Area [mm²] | Microcell Size [µm] | No. of Microcells | Package Dimensions [mm³] | Order-Code |
|---|---|---|---|---|---|
| PM11 | 1.0 x 1.0 | 25 | 1600 | 1.315 x 1.315 x 0.595 | PM1125-WB |
| PM33 | 3.0 x 3.0 | 15 | 38800 | 3.315 x 3.315 x 0.595 | PM3315-WB |
| PM33 | 3.0 x 3.0 | 25 | 13920 | 3.315 x 3.315 x 0.595 | PM3325-WB |
Photo Detection Efficiency
Figure 1: Absolute Photo Detection Efficiency (PDE) of the WB Series SiPMs versus photon wavelength. The peak PDE is at 430 nm. WB Series SiPMs are sensitive over a wide range from 350 nm to 900 nm. The plot shows the values at 5.0 V overvoltage.
Dark Count Rate
Figure 2: Typical Dark Count Rate (DCR) of the WB Series SiPMs versus overvoltage. In comparison to the EB Series SiPMs the DCR greatly improved and is below 100 kHz/mm² in the recommended operating range. Measured at 21°C.
Dynamic Range
Figure 3: Example of an energy spectrum measured with PM3315-WB. The used scintillator crystal LYSO is very bright and typically SiPMs tend to respond non-linear when measuring e.g. a ²²Na source. Due to its high cell density and fast recovery time, PM3315-WB shows a perfectly linear response and both photopeaks (511 keV, 1275 keV) are correctly located on the x-axis. Measured with the SiPM Evaluation Kit at 5.0 V overvoltage.
Used components: PEVAL-KIT-MCX and PE33xx-WB-AX
Used components: PEVAL-KIT-MCX and PE33xx-WB-AX
Coincidence Time Resolution
Figure 4: Coincidence Time Resolution (CTR) of two PM3325-WB with 3 x 3 x 20 mm³ LYSO crystals. Measured with the SiPM Evaluation Kit at 5.0 V overvoltage.
Used components: Two PEVAL-KIT-MCX and two PE33xx-WB-AX
Used components: Two PEVAL-KIT-MCX and two PE33xx-WB-AX
Single Photon Spectrum
Figure 5: Both PM3315-WB and PM3325-WB show an excellent single photon resolution. Measured with the SiPM Evaluation Kit at 4.0 V overvoltage.
Used components: PEVAL-KIT-MCX and PE33xx-WB-AX
Used components: PEVAL-KIT-MCX and PE33xx-WB-AX
Pulse Shape
Figure 6: Typical pulse shape of PM3315-WB and PM3325-WB when illuminating with a short laser pulse (< 1ns). Measured at 5.0 V overvoltage with the SiPM Evaluation Kit and a 5 Ω load resistor.
Used components: PE33xx-WB-AR
Used components: PE33xx-WB-AR
Correlated Noise Probability
Figure 7: Probability of correlated noise after a microcell has been fired by a photon. It includes delayed crosstalk and afterpulses.
