New World Record for Silicon Drift Detectors

120.9eV MnKa energy resolution (FWHM at 5.9keV) demonstrated in an EDX microanalysis application with KETEK’s latest generation 30mm² SDD in combination with an excellent carbon resolution of 46eV. The unprecedented SDD performance, close to theoretical limit, enables material imaging analysis in the nanometer regime.

2016-03-01T14:27:02+01:00January 24th, 2011|