KETEK

history

2013

KETEK presents the world´s largest circular silicon drift detector with an unprecedented     150 mm² active area as a new standard product within the VITUS SDD family.

2013


KETEK completes its Silicon Photomultiplier (SiPM) portfolio with four standard sizes from 1mm² to 36mm² active area in chip size packages.

Market introduction of next generation high performance SDD´s for transmission electron microscope (TEM) applications, offering unprecedented high solid angles.

2012

KETEK presents first fully functional 3x3 mm² Silicon Photomultiplier modules with a photo detection efficiency (PDE)>60%.    

2012

In August 2012, the Mars rover Curiosity lands on the red planet and sends the first XRF analysis data acquired with a VITUS SDD from KETEK.

First samples of the brand new VITUS CUBE SDD series with an ultra-low-capacitance ASIC, replacing the classical FET. Operation at peaking times down to 100ns is possible with input count rates far above 1Mcps and excellent energy resolution.

2011

KETEK expands its SDD production facility at its headquarters in Munich with doubled clean room area.

2011

The brand new VICO electronics product family is introduced with small and compact form factors: Pre-amplifier, peltier controller and high voltage power supply are available.

KETEK begins with its own training programs for employees. The apprenticeship "Electronics for devices and systems" is offered the first time and successfully executed.

2010

KETEK extends its semiconductor production capacity based on 6 inch (150mm) wafer technology.

2010

With an unprecedented energy resolution of 120.9eV, KETEK demonstrates a new world record for Silicon Drift Detectors in an EDX microanalysis application with KETEK's latest generation 30mm² SDD in combination with an excellent carbon resolution of 46eV. The excellent SDD performance, close to theoretical limit, enables material imaging analysis in the nanometer regime.

Ketek launches its first VIAMP modul to the market, which is composed of SDD and pre-amplifier both integrated in a compact case for Handheld and Desktop applications.

Foundation of 'Centre for Microsystem-Integration Munich' (CMM): The well-established partners offer a broad expertise in technology and product development in the area of micro systems and will cooperate in the fields of micro system technology, CMOS, silicon processes as well as vertical system integration.

Ketek introduces a new multi layer collimator for the VITUS vacuum SDD product line as new standard collimator.

2000s

KETEK's new class 1000 clean room has started operation in April 2008. The new facility is equipped with state of the art air filtering and climate controls.

2009

 

 

The new automatic Multitest Environment for detector analyses in vacuum for various energy fields starts its 24h/7days operation.

KETEK offers evacuated SDDs with enlarged temperature budget that allows low power operation for extreme environmental conditions. The SDD is best suited for material analysis with mobile devices. 

KETEK developes and produces optical detectors for single photon counting based on Silicon (Silicon Photo Multiplier).

KETEK has 15000 SDD system for XRF und EDX in operation with a global market share of 40%.


Introduction of the 6th generation of SDDs with improved energy resolution and thermal budget.
KETEKs SDD achieved world record energy resolution of 123,0 eV for Mn Kα line.

2008


 
 
 

Launch of AXAS-M, a new highly modular detector system with separate detector head unit and supply / signal processing unit, available for all VITUS SDDs.

KETEK has been qualified by TÜV Management Services for the integration of a quality management system according to ISO 9001:2000 for "sales, manufacturing and development of semiconductor detectors, detector systems and corresponding electronics".

Relocation of the backend production into KETEKs new cleanroom facilities with largely enhanced production capability.

Market launch of the KETEK Digital Analytical X-ray Acquisition System (AXAS-D), available for all VITUS SDD modules.

2007



Market launch of the 5th generation of SDDs with best analytical performance with P/B up to 20000.

New KETEK management: Dr. Reinhard Fojt and Silvia Wallner.

Dr. Josef Kemmer passed away on October 16th after a long fight against cancer. The company shares remain in his family

Launch of the world´s first Analytical Drift Detector (ADD) integrated into Oxford Instruments´ new INCAx-act. The ADD is based on the superior VITUS technology and performs significantly better at low energies than any other SDD sensor

2006

Introduction of VITUS family, the 4th generation of SDDs with pulsed reset and external first FET.

2005

Development and introduction of the KETEK selective silicon epitaxy for fabrication of advanced radiation detectors.

2004

Innovation award of the consortium of Bavarian Volksbanken and Raiffeisenbanken for KETEK technology and products.
KETEK won the title "Bavarian Medium-sized Enterprise of the Year 2004.

The MER-Rover in NASA's Mars Lander carries six KETEK alpha particle detectors and a customized SDD

2003

 

Presentation of the 3rd generation of SDD with an energy resolution < 128eV at Mn Kα.
Initiation of the electronic product line with the KETEK Analytical X-ray Acquisition System (AXAS) with own development and production.

2002

Development of monolithic and discrete multi-channel SDD systems.

1999-2002

1990s

Development and launch of the first generation of commercial SDD modules.Introduction of KETEK SDD to the XRF and EDX market within a strong co-operation with Röntec.

1995

Contribution to some of the world's most advanced detector projects in high energy physics and space research like XMM Newton.

1989-2002

Main business of KETEK is technology transfer to industry and to research institutes.

1970s & 1980s

Formation of Ketek GmbH by Dr. Josef Kemmer.

1989

Fabrication of the first SDDs by Dr. Josef Kemmer at the TUM utilizing the planar process.
The detector principle was proposed by Emilio Gatti from Politecnico di Milano and Pavel Rehak from Brookhaven National Laboratory.

1983

Development of the planar technology for the fabrication of silicon radiation detectors by Dr. Josef Kemmer at the Technical University of Munich (TUM).

1971-1982

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