NEW

SiPM
WL SERIES

3×3 mm² SiPMs in ultra-compact, quadratic, tileable BGA package
KETEK SiPM - WL Series

Unique Features

  • Ultra low noise

  • Highest photon detection efficiency

  • Excellent timing properties

  • Fastest recovery time

  • Non-magnetic

NOISE IMPROVEMENT COMPARED TO WB SERIES

OPERATING PARAMETERS

Parameter Typ.
Breakdown Voltage (VBD) at 21°C min. 28.75 V, max. 30.25 V
Breakdown Voltage Variation per Reel ±0.125 V
Recommended Overvoltage (VOV) 1.0 V – 6.5 V (max. 7.5 V)

ELECTRICAL AND OPTICAL CHARACTERISTICS

Parameter @  5.0 V (VOV) PM3315-WL PM3335-WL PM3347-WL
Photo Detection Efficiency at 430 nm 29% 41% 47%
Dark Count Rate 45 kHz/mm² 60 kHz/mm² 85 kHz/mm²
Crosstalk Probability 14% 10% 18%
Afterpulsing Probability 3% 3% 3%
Recovery Time τ (at 1 Ω load) 7 ns 35 ns 95 ns

Photo Detection Efficiency vs. Wavelength

Figure 1: Absolute Photo Detection Efficiency (PDE) of the WL Series SiPMs versus photon wavelength. The peak PDE is at 430 nm. The plot shows the values at 5.0 V overvoltage.

KETEK SiPM WL Series - Photo Detection Efficiency vs. Wavelength

KETEK SiPM WL Series - Photo Detection Efficiency vs. Overvoltage

Photo Detection Efficiency vs. Overvoltage

Figure 2: Absolute Photo Detection Efficiency (PDE) of the WL Series SiPMs versus overvoltage. Measured at 430 nm.

Dark Count Rate

Figure 3: Typical Dark Count Rate (DCR) of the WL Series SiPMs. The DCR is significantly improved compared to WB Series.

KETEK SiPM WL Series - Dark Count Rate

KETEK SiPM WB Series - Crosstalk Probability

Crosstalk Probability

Figure 4: Typical Crosstalk Probability (CTP) of the WL Series SiPMs.

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