KEY PARAMETERS VITUS H15LE | ||
| Class | Premium | Standard |
| Energy Resolution | < 136 eV | < 144 eV |
| Peak to Background | > 10000 | > 6000 |
| Peak to Tail | > 2000 | > 1000 |
| Absorption Depth | 450 µm Si | |
| Peak Shift Stability up to 100 kcps | < 1eV | |
| Max. input countrate | 500.000 cps | |
| Windows | AP3.3 Polymer | |
| Cooling Performance | ∆T > 55K | |
| Collimator | Zr or multilayer | |
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The energy resolution of the VITUS H15-LE SDD is dependent on the operating temperature and the shaping time. To achieve good results KETEK recommends an operating temperature below -20°C. Typical operating conditions are -35°C and an analogue shaping time of 4 µs.
The temperature dependency is more significant for longer shaping times.
Finding the optimum operating conditions depends very much on the ambient temperature and on the count rate for the specific application.
The VITUS H15-LE SDD detector offers a high count rate capability up 500 kcps with weak FWHM dependency as shown in the graph for different analogue shaping times.
The data of the example plot has been acquired with a VITUS H15-LE Standard Class detector at an operating temperature of -35°C.
The plots show values up to the maximum reasonable dead time of 60%.