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Wafer SDD

history

Development of the planar technology
for the fabrication of silicon radiation detectors
by Dr. Josef Kemmer at
the Technical University of Munich (TUM)
1971-1982
Fabrication of the first SDDs by Dr. Josef Kemmer at the TUM utilizing the planar process
The detector principle was proposed by Emilio Gatti from Politecnico di Milano
and Pavel Rehak from Brookhaven National Laboratory
1983
Formation of Ketek GmbH  by Dr. Josef Kemmer 1989
Main business of KETEK is technology transfer to industry and to research institutes
Contribution to some of the world's most advanced detector projects
in high energy physics and space research like XMM Newton

1989-2002

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history

Development and launch of the first
generation of commercial SDD modules
Introduction of KETEK SDD to the XRF and EDX
market within a strong co-operation with Röntec
1995
Development of monolithic and discrete multi-channel SDD systems 1999-2002
Manufacturing and delivery of the 1000th commercial SDD
Presentation of the 3rd generation of SDD with an energy resolution < 128eV at Mn Kα
Inituation of the electronic product line with the KETEK Analytical X-ray
Acquisition System (AXAS) with own development and production 
2002
The MER-Rover in NASA's Mars Lander carries six KETEK
alpha particle detectors and a customized SDD

2003

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KETEK was nominated

history

Delivery of the 2000th SDD detector 2004

Innovation award of the consortium of Bavarian
Volksbanken and Raiffeisenbanken
for KETEK technology and products
KETEK won the title "Bavarian Medium-sized
Enterprise of the Year 2004"

Introduction of VITUS family, the 4th generation of SDDs
with pulsed reset and external first FET
2005
Development and introduction of the KETEK selective
silicon epitaxy for fabrication of advanced radiation detectors

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Oxford

history

Launch of the world´s first Analytical Drift
Detector (ADD) integrated into Oxford
Instruments´ new INCAx-act. The ADD is based
on the superior VITUS technology and performs
significantly better at low energies than any other SDD sensor

2006
Delivery of the 6000st SDD, Market launch of the 5th generation
of SDDs with best analytical performance with P/B up to 20000
2007
Market launch of the KETEK Digital Analytical X-ray Acquisition System
(AXAS-D), available for all VITUS SDD modules

New KETEK management: Dr. Reinhard Fojt and Silvia Wallner
Dr. Josef Kemmer passed away on October 16th after a long fight against cancer
The company shares remain in his family

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Iso Zertifizierung

history

More than 10000 KETEK SDDs in the field
Introduction of the 6th generation of SDDs with
improved energy resolution and thermal budget
KETEKs SDD achieved world record energy
resolution of 123,0 eV for Mn Kα line
2008
Launch of AXAS-M, a new highly modular detector system with separate detector head unit and supply / signal processing unit, available for all VITUS SDDs
KETEK has been qualified by TÜV Management Services for the integration of a quality management system according to ISO 9001:2000 for "sales, manufacturing and development of semiconductor detectors, detector systems and corresponding electronics"
Relocation of the backend production into KETEKs new cleanroom facilities with largely enhanced production capability

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New Clean Room

history

KETEK's new class 1000 clean room has started operation in April 2008. The new facility has is equipped with state of the art air filtering and climate controls.2009

The new automatic Multitest Environment for detector analyses in vacuum for various energy fiels starts its 24h/7days operation.

KETEK offers evacuated SDDs with enlarged temperature budget that allows low power operation for extreme environmental conditions Umweltbedingungen. The SDD is best suited for material analysis with mobile devices.
KETEK developed and produces optical detectors for single photon counting based on Silicon (Silicon Photo Multipier).
KETEK has 15000 SDD system for XRF und EDX in operation with a global market share of 40%.

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history

KETEK has sold more than 19000 SDDs for
EDXRF and EDX applications - the global
market share increased to 41%.
2010

KETEK extends its semiconductor production
capacity based on 6 inch (150mm) wafer technology.

With an unprecedented energy resolution of 120.9eV, KETEK demonstrates
a new world record for Silicon Drift Detectors in an EDX microanalysis application with
KETEK's latest generation 30mm² SDD in combination with an excellent carbon resolution of 46eV. The excellent SDD performance, close to theoretical limit, enables material imaging analysis in the nanometer regime.

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history

Foundation of 'Centre for
Microsystem-Integration Munich' (CMM):
The well-established partners offer a
broad expertise in technology and product
development in the area of micro systems
and will cooperate in the fields of micro system
technology, CMOS, silicon processes as well
as vertical system integration.

2010

Ketek introduces a new multi layer collimator for the
VITUS vacuum SDD product line as new standard collimator.

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